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Nanometrics 7203-030839 200mm Wafer Analyzer Inspection Stage 8.33 Working img{max-width:100%} Varian Semiconductor Equipment E16106841

SKU: 39055893051
4.5
USD3252.12 USD3288.12

Pay in 4 interest-free payments of $813.03 Learn more

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Ships within 48 hours · Estimated delivery Aug 31 - Sep 5

Description

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Made in the USA This AMAT Applied Materials 0021-25875 Bocker Plate is new surplus

Nanometrics 7203-030839 200mm Wafer Analyzer Inspection Stage 8.33 Working img{max-width:100%} Varian Semiconductor Equipment E16106841Nanometrics 7203 030839 200mm Wafer Analyzer Inspection Stage 8. 33 Working Part No: 7203 030839 DPWIN: 8. 33 FE 8. 34 Made in the USA This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 112 lbs. Shipping Terms: All Domestic and International shipping quotes and or fees are

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
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